Growth, stability and decomposition of Mg2Si ultra-thin films on Si (100)
نویسندگان
چکیده
منابع مشابه
Growth, stability and decomposition of Mg 2 Si ultra-thin films on Si (100)
Using Auger Electron Spectroscopy (AES), Scanning Tunneling Microscopy/Spectroscopy (STM/STS) and Low Energy Electron Diffraction (LEED), we report an in-situ study of amorphous magnesium silicide (Mg2Si) ultra-thin films grown by thermally enhanced solid-phase reaction of few Mg monolayers deposited at room temperature (RT) on a Si(100) surface. Silicidation of magnesium films can be achieved ...
متن کاملEpitaxial ternary RexMo1-xSi2 thin films on Si(100)
Reactive deposition epitaxy was used to synthesize thin layers of RexMo1 _ _x8i2 on Si(lOO). In the case of x= 1, ReSi2 layers of excellent crystalline quality have been reported previously [J. E. Mahan, K. M. Geib, G. Y. Robinson, R. G. Long, Y. Xinghua, G. Bai, and M.-A. Nicolet, Appl. Phys. Lett. 56, 2439 ( 1990) ]. In the case of x = 0, however, virtually no alignment of the MoSi2 and the s...
متن کاملarchitecture and engineering of nanoscale sculptured thin films and determination of their properties
چکیده ندارد.
15 صفحه اولTi/Si thin films during ultra rapid thermal annealing
WC introduce a new technique for rapidly heating (10’ “C/s) thin films using an electrical thermal annealing (ETA) pulse technique. By applying a high-current dc electrical pulse to a conductive substrate-heater material (Si), joule heating occurs thus heating the thin film. This method was demonstrated by heating thin films of aluminum at rates ranging from lo3 to lo6 “C/s. The temperature of ...
متن کاملEpitaxial growth of Cu ( 100 ) and Pt ( 100 ) thin films on perovskite substrates Andrew
Pulsed laser deposition (PLD) has been used to grow epitaxially oriented thin films of Cu and Pt on (100)-oriented substrates of both SrTiO3 and LaAlO3. The resulting films have been characterized for their crystalline orientations using x-ray diffraction (XRD) and for their surface morphologies using atomic force microscopy (AFM). The diffraction results illustrated that purely epitaxial Cu(10...
متن کاملذخیره در منابع من
با ذخیره ی این منبع در منابع من، دسترسی به آن را برای استفاده های بعدی آسان تر کنید
ژورنال
عنوان ژورنال: Applied Surface Science
سال: 2018
ISSN: 0169-4332
DOI: 10.1016/j.apsusc.2017.09.027